Product Information CUSTOMER BENEFITS First industrial microCT system with advanced scatter|correct technology for highly improved CT quality level compared to conventional microfocus cone beam CT High precision 3D metrology and non-destructive testing tasks performed with minimal operator training Increased throughput due to high power X-ray tube, efficient, fast detector technology and a high grade of automation Very high image quality due to unique GE DXR detector array (up to 30 fps) for extremely fast CT data acquisition All major hardware and CT software components of the system are proprietary GE technology optimally compatible with one another NEW: The phoenix v|tome|x m is now also available in specific countries as special metrology edition with a measurement accuracy of 4 L/100 µm referring to VDI 2630 guideline (measured as deviation of sphere distance in tomographic static mode SD (TS), method details referring to VDI 2630-1.3 guideline on request, valid only for phoenix v|tome|x m metrology edition). KEY FEATURES First compact 300 kV microfocus CT system with < 1 µm detail detectability Industry-leading magnification and power at 300 kV for high absorbing samples Unique dual|tube configuration for high power µCT as well as high resolution nanoCT® Optimized ease of use due to advanced phoenix datos|x CT software with automated click & measure|CT option Optimized CT acquisition conditions and 3D metrology package with temperature stabilized X-ray tube, digital detector array and cabinet as well as high accuracy direct measuring system Resources phoenix v|tome|x m Data Sheet
