Product Information The Leeb Measuring Principle – Invented by Proceq Leeb hardness principle is based on the dynamic (rebound) method. An impact body with a hard metal test tip is propelled by spring force against the surface of the test piece. Surface deformation takes place when the impact body hits the test surface, which results in loss of kinetic energy. This energy loss is detected by a comparison of velocities vi and vr when the impact body is at a precise distance from the surface for both the impact and rebound phase of the test, respectively. Velocities are measured using a permanent magnet in the impact body that generates an induction voltage in the coil which is precisely positioned in the impact device. The detected voltage is proportional to the velocity of the impact body. Signal processing is then providing the hardness reading. Applications Standard to large objects Round objects : In combination with support rings Limited accessibility : With impact devices Leeb DC and DL Light objects : With impact device Leeb C Very hard objects : With impact devices Leeb S and E Cast objects : With impact device Leeb G Polished objects : With impact device Leeb C Additional Applications : Fire damage assessment Engine cylinder Narrow automotive parts Aluminium castings Steel rolls Marine industry Transmission gears Rolling mills Leeb and Portable Rockwell combined Automotive system integration Thermal cutting Stator wedge Overview Your Benefits Use full Leeb probe portfolio and combine with Portable Rockwell and UCI Comes with the high accuracy known for all Equotip products Ready-to-go reports through powerful built-in reporting feature Native Scale HL Measuring Range 150 – 950 HL Measuring Accuracy ± 4 HL (0.5% at 800 HL) Available Scales HB, HV, HRA, HRB, HRC, HS, MPA Available Probes Leeb D / DC / DL / S / E / G / C Combination With Other Methods Portable Rockwell, UCI Average Roughness Ra (µm / µinch) 7 / 275 (Leeb G) Minimum Mass (kg / lbs) 0.02 / 0.045 (Leeb C) Minimum Thickness (mm / inch) 1 / 0.04 (Leeb C) Features Instrument Firmware Automatic compensation for impact direction Personalized user profiles and views Integration in automated testing environments (incl. remote control) 11 Languages and timezone supported PC Software Equotip Link allowing direct reporting and custom reports Display 7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor Memory Internal 8 GB flash memory (> 1’000’000 measurements) Connections USB host / device and Ethernet Standardization Standards ASTM A 956 ASTM E 140 ASTM A 370 ISO 16859 DIN 50156 GB/T 17394 JB/T 9378 Guidelines ASME CRTD-91 DGZfP Guideline MC 1 VDI / VDE Guideline 2616 Paper 1 Nordtest Technical Reports 424-1, 424-2, 424-3 Accessories Measurement Accessories Equotip Leeb Impact Device D (356 00 100) Equotip Leeb Impact Device E (356 00 400) Equotip Leeb Impact Device G (356 00 300) Set of support rings 12 pcs. for D/DC/C/E/S) (353 03 000) Battery complete (327 01 033) Quick Charger (external) (327 01 053) 2-in-1 Kits Special Offers: Equotip 550 Portable Rockwell & Leeb D Kit (356 10 021), Equotip 550 Leeb D & UCI Kit (356 10 022) Verification Tools Equotip Test Block E, ~810 HLE / ~63 HRC (357 14 400) Equotip Test Block G, ~570 HLG / ~340 HB (357 32 300) Equotip Test Block D/DC, ~775 HLD / ~56 HRC (357 13 100) Resources Equotip 550 Leeb Datasheet Equotip 550 Brochure
