Product Information The Rockwell Measuring Principle The test principle of the Equotip Portable Rockwell follows the traditional Rockwell static test method. During measurements with the Equotip Portable Rockwell Probe, a diamond indenter is forced into the test piece using a precisely controlled force. The indentation depth of the diamond is continuously measured while a load is applied and released. From the indentation depths d1 and d2 recorded at two defined loads, the difference is calculated: Δ = d2 – d1 . This is traditionally referred to as plastic deformation. Applications Standard to large objects Round objects Light objects Very hard objects Polished objects Thin objects Additional Applications : Prime mover hydraulic cylinder Automotive parts Differences in alloys Accuracy for small components Thin walled metal pipes Composite materials Steel rings Watch components Aging roadway metals Heavy and bulky forging dies Extruded aluminium Medical wires Small components Leeb and Portable Rockwell combined Thermal cutting Gigantic saws Overview Your Benefits Combine with Leeb and UCI Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers Ready-to-go reports through powerful built-in reporting feature Native Scale µm, µinch Measuring Range 0 – 100 µm; 19 – 70 HRC; 35 – 1‘000 HV Measuring Accuracy ± 0.8 µm; ~ ± 1.0 HRC Available Scales HB, HV, HRA, HRB, HRC, R15N, HR15T, HMMRC, MPA Available Probes Portable Rockwell Probe 50N (can also be connected directly to PC) Combination With Other Methods Leeb, UCI Average Roughness Ra (µm / µinch) 2 / 80 Minimum Mass (kg / lbs) No Requirement Minimum Thickness (mm / inch) 10 x indendation depth Features Instrument Firmware Personalized user profiles and views Integration in automated testing environments (incl. remote control) 11 Languages and timezone supported PC Software Equotip Link allowing direct reporting and custom reports Display 7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor Memory Internal 8 GB flash memory (> 1’000’000 measurements) Connections USB host / device and Ethernet Standardization Standards DIN 50157 Guidelines DGZfP Guideline MC 1 VDI / VDE Guideline 2616 Paper 1 Nordtest Technical Reports 424-1, 424-2, 424-3 Accessories Measurement Accessories Equotip Portable Rockwell Probe 50N (for Equotip 550 or PC) (356 00 600) Equotip Portable Rockwell Measuring Clamp (354 01 200) Equotip Portable Rockwell Special Foot RZ 18 mm – 70 mm (354 01 250) Equotip Portable Rockwell Special Foot RZ 70 mm – ∞ (354 01 253) Battery complete (327 01 033) Quick Charger (external) (327 01 053) 2-in-1 Kits Special Offers: Equotip 550 Portable Rockwell & UCI Kit (356 10 020), Equotip 550 Portable Rockwell & Leeb D Kit (356 10 021) Verification Tools Equotip Portable Rockwell Test Block ~62 HRC, ISO 6508-3 HRC Calibration (357 44 100) Resources Equotip 550 Portable Rockwell Datasheet Equotip 550 Brochure
